Tunnel quality inspection solution

The AI LCD glass defect online detection solution is based on the deep learning algorithms of ManuVision intelligent machine vision platform developed by AInnovation, which can effectively identify and classify the defects of LCD glass.

Solution Advantages

- To accurately identify any production risks such as chipped edges to prevent glass fragments from resulting in downtime and false alarms in the production line, so as to improve production efficiency.
- To reduce quality issues in circuit production and LDC imaging due to surface scratches and stains.

核心价值

Traceable Reduce Costs Improve Processes

Integrated quality inspection machines for silicon wafers

Based on its independently developed ManuVision intelligent machine vision platform, AInnovation has used its deep learning technology with higher accuracy and efficiency to create an innovative integrated smart quality inspection machine for silicon wafer manufacturers to fix the problem of low inspection efficiency in a one-stop solution, contributing to the improvement of the full-process yield rate of silicon wafer production in China.

Solution Advantages

- To automatically test a whole box of silicon wafers without manual intervention. To test the front and back of a silicon wafer at the same time.
- To avoid secondary damage to the product during inspection that may be caused by traditional random tests.

核心价值

High Precision Economic benefits Traceable